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材料表征原版系列丛书 有机薄膜的表征 英文版
作者：（美）布伦德尔，（美）埃文斯，（美）乌尔曼 主编
出版时间： 2014年版
内容简介
Analytical tools for the study of organic thin films have seen dramatic developments in the last decade. Using such tools it has become possible to obtain structural information at the molecular level and thus to relate materials structure to materials properties. Characterization of Organic Thin Films will help materials scientists， physicists， chemists， and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing. This volume begins with introductory chapters on Langmuir-Blodgett and self-assembled films， and continues with the discussion of their properties as studied by different analytical techniques. Both their surface/interfacial and bulk properties are covered.
目录
Preface to Series
Preface to the Reissue of Characterization of Organic Thin Films
Preface
Contributors
PART 1 PREPARtITION AND MATERIALS
LANGMUIR-BLODGETT FILMS
1.1 Introduction
1.2 L-B Films ofLong-Chain Compounds
FattyAcids 6, Amines 8, OtherLong-ChainCompounds
1.3 CyclicCompoundsandChromophores
1.4 PolymersandProteins
1.5 PolymerizationInSitu
1.6 Alternation Films （Superlattices）
1.7 PotentiaIApplications
SELF-ASSEMBLED MONOIAYERS
2.1 Introduction
2.2 MonolayersofFattyAcids
2.3 MonolayersofOrganosiliconDerivatives
2.4 Monolayers ofAlkanethiolates on Metal and Semiconductor Surfaces
2.5 Self-Assembled Monolayers ContainingAromatic Groups
2.6 Conclusions
PART 2 ANALYSIS OF FILM AND SURFACE PROPERTIES
SPECTROSCOPIC ELLIPSOMETRY
3.1 Introduction and Overview
3.2 TheoryofEllipsometry
3.3 Instrumentation
3.4 DeterminationofOpticalProperties
Analysis of Single Ellipsometric Spectra: Direct Inversion Methods Analysis ofSingle Ellipsometric Spectra: Least- Squares RegressionAnalysis Method Analysis ofMultiple EllipsometricSpectra
3.5 Determination ofThin Film Structure
Thickness DeterminationforMonolayers Microstructural
Evolution in Thick Film Growth
3.6 Future Prospects
INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS
4.1 Introduction
Specific Needs for Characterizing Organic Thin Films
General Prinaples and Capabilities oflnfrared Spectroscopy for
Surface and Thin Film Analysis
4.2 QuantitativeAspects
Spectroscopic Intensities Electromagnetic Fields in Thin
Film Structures
4.3 TheInfraredSpectroscopicExperiment
Generallnstrumentation 71, ExperimentaIModes
AdditionaIAspects
4.4 ExamplesofApplications
Self-Assembled Monolayers on Gold by External Reflection 81,
Octadecylsiloxane Monolayers on Si02 byTransmission 82,
Langmuir-Bfodgett Films on Nonmetallic Substrates by External
Reflection
RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS
5.1 Introduction
5.2 Fundamentals ofRaman Spectroscopy
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